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  • TENCOR SURFSCAN 7700M

    The Tencor Surfscan 7700M is a wafer inspection system designed for precise detection and measurement of surface defects and particles. It utilizes advanced laser scattering technology to monitor wafer cleanliness and surface quality [...]

    Glenn Walker
  • From PS

    SPECIM FX10e HYPERSPECTRAL CAM
    XIANGYU,LIU
  • From PS

    COSMED PORTABLE METABOLICCART
    DESBROW,BEN
  • From PS

    AGILENT TECHNOLOGIES UV/ELSD
    LANG,REBECCA
  • From PS

    NIKON ECLIPSE Ts2-FL
    NGUYEN,QUANG
  • Nikon Ts2-FL

    Inverted Microscope

    This is a compact yet efficient inverted microscope with 3x FL channels. It is located in a Mammalian Tissue Culture laboratory to support rapid cell growth assessment and capture simple live cell images and short videos.

    Nathan
  • From PeopleSoft - Archived

    HITECH FURNACES: TWO STACK FUR
    IACOPI,ALAN
  • Filmetrics F40-NSR

    Thin Film Analyser

    The F40 thickness measurement instrument comes complete with an integrated color video camera that allows exact monitoring of the film thickness measurement spot. Thickness and refractive index can be measured in less than a second. 

    340305 - Physical properties of materials
    Nathan
    Leonie Hold