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  • TENCOR SURFSCAN 7700M

    The Tencor Surfscan 7700M is a wafer inspection system designed for precise detection and measurement of surface defects and particles. It utilizes advanced laser scattering technology to monitor wafer cleanliness and surface quality [...]

    Glenn Walker

  • From PS

    SPECIM FX10e HYPERSPECTRAL CAM
    XIANGYU,LIU

  • From PS

    COSMED PORTABLE METABOLICCART
    DESBROW,BEN

  • From PS

    AGILENT TECHNOLOGIES UV/ELSD
    LANG,REBECCA